ASSET InterTech's Boundary-Scan Test, Processor-Controlled Test and I/O Instrumentation for Intel® IBIST are unique tools for access, automation and analysis of embedded instrumentation.
Balancing Coverage, Test Time, Diagnostics, Control.
The optimum test strategy for your circuit board is going to balance several factors. No doubt you’ll want maximum test coverage, the fastest test time possible, and when there’s a fault, you have to know exactly where it is and why it happened. And one more thing: you need control over the entire test process with as few dependencies as possible.
The ScanWorks platform with its multiple test technologies gives you options. Effective options.
Need more test coverage? ScanWorks’ processor-controlled test (PCT) very well could be the answer. Test times too high? Boundary-scan test would likely speed up the test process. On-board interconnects acting up? High-speed I/O validation and test tools could do the trick. That’s ScanWorks. Multiple test technologies all in one environment. Software-driven to reduce your equipment investment. Fast. Easy to manage. Resource-rich so you can quickly develop optimal test strategies. Suddenly, you have the options you need to optimize your test process.
Check out the board test technologies on the ScanWorks platform for embedded instruments:
Boundary-Scan Test
Processor-Controlled Test
I/O Instrumentation
EMC is sold on ScanWorks. EMC’s hardware test manager discusses non-intrusive board test with ScanWorks.
Click here to view the presentation.
An Intel® reference design needed test coverage. ScanWorks delivered.
Ten-minute hands-on video.
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